TS27M4CD >
TS27M4CD
STMicroelectronics
IC CMOS 4 CIRCUIT 14SO
1486 Pcs New Original In Stock
CMOS Amplifier 4 Circuit 14-SO
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TS27M4CD STMicroelectronics
5.0 / 5.0 - (187 Ratings)

TS27M4CD

Product Overview

12871663

DiGi Electronics Part Number

TS27M4CD-DG
TS27M4CD

Description

IC CMOS 4 CIRCUIT 14SO

Inventory

1486 Pcs New Original In Stock
CMOS Amplifier 4 Circuit 14-SO
Quantity
Minimum 1

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TS27M4CD Technical Specifications

Category Linear, Amplifiers, Instrumentation, Op Amps, Buffer Amps

Manufacturer STMicroelectronics

Packaging -

Series -

Product Status Obsolete

Amplifier Type CMOS

Number of Circuits 4

Output Type -

Slew Rate 0.6V/µs

Gain Bandwidth Product 1 MHz

Current - Input Bias 1 pA

Voltage - Input Offset 1.1 mV

Current - Supply 150µA (x4 Channels)

Current - Output / Channel 45 mA

Voltage - Supply Span (Min) 3 V

Voltage - Supply Span (Max) 16 V

Operating Temperature 0°C ~ 70°C

Mounting Type Surface Mount

Package / Case 14-SOIC (0.154", 3.90mm Width)

Supplier Device Package 14-SO

Base Product Number TS27M4

Datasheet & Documents

HTML Datasheet

TS27M4CD-DG

Environmental & Export Classification

RoHS Status ROHS3 Compliant
Moisture Sensitivity Level (MSL) 1 (Unlimited)
REACH Status REACH Unaffected
ECCN EAR99
HTSUS 8542.33.0001

Additional Information

Standard Package
50

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5.0/5.0-(Show up to 5 Ratings)
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December 02, 2025
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Frequently Asked Questions (FAQ)

Can I use the TS27M4CD as a drop-in replacement for the TLC27M9IDR in a low-power signal conditioning circuit, and what design-in risks should I consider despite similar CMOS architectures?

The TS27M4CD can serve as a functional alternative to the TLC27M9IDR in low-power applications due to similar CMOS input stages and supply current (150µA per channel), but it is not a drop-in replacement without verification. Key differences include the TS27M4CD's lower gain bandwidth product (1 MHz vs. up to 2.7 MHz on TLC27M9IDR) and slightly higher input offset voltage (1.1 mV vs. 0.5 mV typical). In precision signal conditioning, this could affect loop stability or DC accuracy. Additionally, the TS27M4CD is marked as obsolete, so long-term availability is a risk for production designs. Always verify slew rate (0.6 V/µs) compatibility in dynamic applications and ensure layout accommodates the 14-SOIC footprint to avoid thermal or signal integrity issues during replacement.

What are the main reliability concerns when operating the TS27M4CD near its maximum 16 V supply voltage in an industrial temperature environment?

Although the TS27M4CD is rated for a 3–16 V supply, prolonged operation near 16 V in industrial environments (approaching 70°C) increases long-term stress on the CMOS oxide layers, potentially accelerating parameter drift or failure. Since the device has no extended temperature grade (limited to 0°C–70°C), ambient self-heating from load currents (up to 45 mA/channel) or PCB hot spots can push internal junctions beyond safe limits. To mitigate risk, derate the supply voltage to ≤14 V, ensure adequate copper pour for heat dissipation, and avoid capacitive loading >100 pF to prevent oscillation under high gain. Also consider the device's obsolete status—reliability data may no longer be actively updated by STMicroelectronics.

How does the 1 pA input bias current of the TS27M4CD benefit high-impedance sensor interfaces, and what PCB layout practices prevent leakage currents from degrading performance?

The ultra-low 1 pA input bias current of the TS27M4CD makes it ideal for interfacing high-impedance sensors like pH electrodes, photodiodes, or piezoelectric transducers where even nanoampere-level leakage would introduce significant error. However, real-world performance depends on PCB layout: contamination, humidity, or flux residue can create surface leakage paths exceeding the amplifier’s bias current. To preserve accuracy, use guard rings around input traces connected to a low-impedance node (e.g., output or common), increase creepage distances (>1 mm), apply conformal coating, and route high-impedance traces only on the top layer with ground plane cuts beneath. Avoid vias in input paths and clean the board thoroughly after assembly.

When replacing the LM2902M/NOPB with the TS27M4CD in a single-supply rail-to-rail input upgrade, what key performance trade-offs should be evaluated?

Swapping the LM2902M/NOPB with the TS27M4CD improves input common-mode range (rail-to-rail CMOS vs. bipolar limited), supports lower input bias current (1 pA vs. 20 nA), and reduces power per channel. However, trade-offs include lower slew rate (0.6 V/µs vs. 0.3–0.7 V/µs depending on supply), potentially slower transient response, and absence of rail-to-rail output swing specification in the TS27M4CD—outputs may not drive within 100 mV of the rails under load. Additionally, the TS27M4CD’s higher input offset voltage (1.1 mV max) may require calibration in precision applications where the LM2902M/NOPB performs better. Verify stability with capacitive loads and consider the obsolete status for new designs.

What design constraints limit the use of TS27M4CD in battery-powered, multi-channel data acquisition systems despite its low supply current?

While the TS27M4CD draws only 150µA per channel—making it attractive for battery-powered systems—its 1 MHz gain bandwidth and 0.6 V/µs slew rate constrain high-channel-count or rapidly switching multiplexed inputs. If the ADC sampling rate exceeds 10 kSPS, the amplifier may not settle accurately between cycles, introducing cross-talk or distortion. Additionally, the input bias current, while ultra-low, becomes variable with input voltage (especially near rails), requiring DC blocking or AC coupling in some topologies. The device’s obsolete status also limits lifecycle support, and its 14-SOIC package lacks modern power-saving shutdown modes found in newer alternatives. Always verify start-up time and stability into the ADC’s input capacitance to avoid system-level performance degradation.

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